10 November 2003 Optical and thermal studies of deep levels in the photothermoplastic PVK:TNF
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Thin films of the organic complex PVK:TNF were studied for various rates of TNF (0 to 50%) by means of photoinduced current transient spectroscopy (PICYS) and photoconductivity measurements. PICTS reveals the presence of a continuous trap distribution. Both the two models of the transport phenomenon by hopping (microscopic behavior) or by multiple trapping (more efficient for a quantitative explanation) explain the shape of the decay of photoconductivity and the observed results. Contrarily to amorphous semiconductors, the trap distribution is not here exponential. In a first approximation, the distribution is fairly uniform until 0.6-0.65 eV, followed by a sharp decrease until about 0.85 eV where the density of states practically vanishes. The microscopic model of hopping allow an interpretation of the distribution and gives a plausible explanation of the observed results.
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Mayer Tapiero, Mayer Tapiero, "Optical and thermal studies of deep levels in the photothermoplastic PVK:TNF", Proc. SPIE 5212, Linear and Nonlinear Optics of Organic Materials III, (10 November 2003); doi: 10.1117/12.508026; https://doi.org/10.1117/12.508026

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