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10 November 2003 Strong-coupled exciton and photon modes in conjugated-polymer-based microcavities
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The strong coupling between exciton and photon modes in a conjugated polymer-based semiconductor microcavity was observed. The σ-conjugated poly(bis(p-butylphenyl)silane) (PBPS) thin films were inserted between metal and dielectric stack mirrors to form the microcavity structure. Change of the PBPS film-thickness (from 80 to 140 nm) allowed the cavity photon resonance to be tuned in the free-exciton transition. The expected anti-crossing behavior was observed at room temperature in the reflection spectra and the vacuum Rabi-splitting energy was found to be about 430 meV. This giant value is almost the same as the expectations of transfer matrix reflectivity calculations performed with optical constants (refractive index: n, extinction coefficient: k) derived from a Kramers-Kronig analysis of the PBPS absorption spectrum. Angle-dependent photoluminescence measurements were performed in each PBPS-based microcavity. In the microcavity with a 120nm-PBPS layer, the polariton emission that displays almost no blueshifts with angle was observed, a desirable feature for potential display applications.
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Noriyuki Takada, Toshihide Kamata, and Donal D. C. Bradley "Strong-coupled exciton and photon modes in conjugated-polymer-based microcavities", Proc. SPIE 5212, Linear and Nonlinear Optics of Organic Materials III, (10 November 2003);

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