4 November 2003 Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element
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Proceedings Volume 5226, 12th International School on Quantum Electronics: Laser Physics and Applications; (2003) https://doi.org/10.1117/12.519489
Event: 12th International School on Quantum Electronics Laser Physics and Applications, 2002, Varna, Bulgaria
Abstract
An electronic speckle pattern interferometry (ESPI) system for detection of cracks and defects is presented. In the first stage a holographic optical element (HOE) is recorded using a photopolymer material. Since the polymerization process occurs during recording, the holograms are produced without any development/processing. In the second stage the HOE is used in an ESPI configuration for detection of cracks and defects. Due to the introduction of the HOE in the ESPI set-up, precise alignment of the optical elements is not necessary. For this reason the system is well suited for industrial applications.
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Emilia Mitkova Mihaylova, Emilia Mitkova Mihaylova, Vincent Toal, Vincent Toal, Sridhar Reddy Guntaka, Sridhar Reddy Guntaka, Suzanne Martin, Suzanne Martin, "Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element", Proc. SPIE 5226, 12th International School on Quantum Electronics: Laser Physics and Applications, (4 November 2003); doi: 10.1117/12.519489; https://doi.org/10.1117/12.519489
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