4 November 2003 Speckle-shear interferometry with increased sensitivity
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Proceedings Volume 5226, 12th International School on Quantum Electronics: Laser Physics and Applications; (2003) https://doi.org/10.1117/12.519488
Event: 12th International School on Quantum Electronics Laser Physics and Applications, 2002, Varna, Bulgaria
An improved sensitivity in speckle-shear interferometry for out-of-plane displacements measurement using 2D folding shear is obtained. A triple prism as a shearing device is utilized. The sensitivity of measurement is up to two times higher in comparison with the one-dimensional folding shear at the same loading of the object. The same approach was feasible to be applied for deformation investigation of microstructures with magnification. The proposed method is especially suitable for symmetrical field deformation measurement, residual stress detection, continuous monitoring of object subjected to risk and other tasks of non-destructive testing.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ventseslav Christov Sainov, Ventseslav Christov Sainov, Nikola Mechkarov, Nikola Mechkarov, Assen Shulev, Assen Shulev, Wim De Waele, Wim De Waele, Joris Degrieck, Joris Degrieck, Pierre Michel Boone, Pierre Michel Boone, } "Speckle-shear interferometry with increased sensitivity", Proc. SPIE 5226, 12th International School on Quantum Electronics: Laser Physics and Applications, (4 November 2003); doi: 10.1117/12.519488; https://doi.org/10.1117/12.519488

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