Beam characterization of commercial red and infrared diode lasers

Dan G. Sporea; Mircea V. Udrea

doi:10.1117/12.519898

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30 September 2003 Beam characterization of commercial red and infrared diode lasers

Dan G. Sporea, Mircea V. Udrea

Author Affiliations +

Proceedings Volume 5227, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies; (2003) https://doi.org/10.1117/12.519898
Event: 2003 Chapter books, 2003, Bellingham, WA, United States

Abstract

Commercial available red and infrared diode lasers have been tested. A set of ten pieces of red 25 mW nominal output power and five pieces of 0.5 W infrared diode lasers have been investigated. The laser output power has been measured by using an Ophyr power-meter. Ophyr F150 head (3mW noise) was used for power measurements of the infrared diode laser and Ophyr 3A-IS integrated sphere was used in the case of red diode lasers. A Spiricon laser beam analyzer was used to determine the beam intensity distribution. An API wave-check wavelength meter measures the wavelength of the diode lasers. Temporal behavior of the diode lasers over periods of days was recorded. The influence of ambiental conditions is considered. Our study guarantees the proper choice of the diode laser to be used in specific applications such as medical, and industrial applications.

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Dan G. Sporea and Mircea V. Udrea "Beam characterization of commercial red and infrared diode lasers", Proc. SPIE 5227, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies, (30 September 2003); https://doi.org/10.1117/12.519898

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