30 September 2003 New feasibilities for characterizing rough surfaces by optical correlation techniques
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Proceedings Volume 5227, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies; (2003); doi: 10.1117/12.519637
Event: 2003 Chapter books, 2003, Bellingham, WA, United States
Abstract
New feasibilities are considered for optical correlation diagnostics of rough surfaces with different distributions of irregularities. The influence of deviations of the height surface roughness distribution from a Gaussian probability distribution on the accuracy of optical analysis is discussed. The possibilities for optical diagnostics of fractal surface structures are shown and the set of statistical and dimensional parameters of the scattered fields for surface roughness diagnostics us determined. Finally, a multifunctional measuring device for estimation of these parameters is proposed.
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Oleg V. Angelsky, Peter P. Maksimyak, "New feasibilities for characterizing rough surfaces by optical correlation techniques", Proc. SPIE 5227, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies, (30 September 2003); doi: 10.1117/12.519637; http://dx.doi.org/10.1117/12.519637
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KEYWORDS
Fractal analysis

Diagnostics

Surface roughness

CCD cameras

Computer simulations

Diffraction

Measurement devices

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