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Optical metrology of thin films using high-accuracy spectrophotometric measurements with oblique angles of incidence
Optical and structural inhomogeneity in reactive evaporated and IAD CeO2 films analyzed by x-ray diffraction and reverse optical engineering
Characterization of multilayer dielectric coatings by ellipsometry and x-ray grazing incidence reflectometry
Magneto-optical properties of yttrium iron garnet (YIG) thin films elaborated by radio frequency sputtering
Structural and optical characterizations of sol-gel-derived europium-doped YAG materials: powders and films
Aging under mechanical stress: first experiments and related simulations for a silver-based multilayer mirror
Submicrometer scale growth morphology control: a new route for the making of photonic crystal structures?
Development of dielectric and amorphous-silicon-based thin film coatings for room- and cryogenic temperature applications
Determination of refractive index profile of ZrO2 on amorphous and pre-evaporated substrates by reverse engineering
High-quality sol-gel thin films: elaboration, studies in waveguiding configuration, and application to sol-gel scintillators
Determination of optical parameters of phthalocyanine LB films based on reflection property of p-polarized beam