Correlation between laser-induced damage and nanosized absorbing defects

Bertrand Bertussi; Jean-Yves Natoli; Annelise During; Mireille Commandre; Laurent Gallais; Jean Luc Rullier; Herve Bercegol; Philippe Bouchut

doi:10.1117/12.513373

25 February 2004 Correlation between laser-induced-damage and nanosized absorbing defects

Bertrand Bertussi, Jean-Yves Natoli, Annelise During, Mireille Commandre, Laurent Gallais, Jean Luc Rullier, Herve Bercegol, Philippe Bouchut

Author Affiliations +

Proceedings Volume 5250, Advances in Optical Thin Films; (2004) https://doi.org/10.1117/12.513373
Event: Optical Systems Design, 2003, St. Etienne, France

Abstract

In the context of high power laser applications like the French "Laser Megajoule" or the "National Ignition Facility" in the United States, laser-induced-damage in fused silica appears to be a limitation. Although it has been established that nano-sized defects are suspected to be responsible of the damage initiation in optical components, the induced-breakdown process is still unknown. The specific apparatus developed at the Institut Fresnel permits to study in real time the laser interaction on an isolated absorbing defect (around 100 nm): Indeed the coupling of a nanosecond focused laser (beam diameter about 10μm) and a high resolution photothermal microscope (beam diameter 1μm) in a unique facility permits to highlight the evolution of the local absorption of the defect versus irradiation energy density. Furthermore, the morphology of this modification is followed thanks to a "refraction mapping" (photothermal deflection measured at frequency 0). An in-situ dark field microscope and an ex-situ AFM complete the observations. In order to simulate the presence of the nano-defects, engineered sub-micronic gold particles (100-600 nm) were embedded in silica samples. The whole observations contribute in the understanding of the different stages of the damage initiation and more particularly, a determination of a "pre-damage" threshold can be performed.

Citation Download Citation

Bertrand Bertussi, Jean-Yves Natoli, Annelise During, Mireille Commandre, Laurent Gallais, Jean Luc Rullier, Herve Bercegol, and Philippe Bouchut "Correlation between laser-induced-damage and nanosized absorbing defects", Proc. SPIE 5250, Advances in Optical Thin Films, (25 February 2004); https://doi.org/10.1117/12.513373

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