25 February 2004 Monitoring the last two (AR) layers in narrow-bandpass filters
Author Affiliations +
Abstract
The final corrections which might be made in the last two antireflection (AR) layers in the deposition of narrow bandpass filter designs such as might be used for Dense Wavelength Division Multiplexing (DWDM) in the fiber optics communications field were discussed in a previous report. A broader range of techniques and simulations of those final layer adjustments are described here, how they can be done, and the benefits which might be obtained. A surprisingly simple new technique is given which should yield improved results.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ronald R. Willey, "Monitoring the last two (AR) layers in narrow-bandpass filters", Proc. SPIE 5250, Advances in Optical Thin Films, (25 February 2004); doi: 10.1117/12.510715; https://doi.org/10.1117/12.510715
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT


Back to Top