Paper
26 February 2004 Fabrication and determination of refractive index profile of the planar waveguides by wedge technique
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Abstract
In this paper we will present determination of refractive index profile of an ion exchanged planar waveguide using wedge technique. The sample preparation, data analysis and experimental results will be presented.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Seyed Mohammad Reza Sadat Hosseini, Ahmad Darudi, and Mohammad Taghi Tavassoly "Fabrication and determination of refractive index profile of the planar waveguides by wedge technique", Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); https://doi.org/10.1117/12.503918
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KEYWORDS
Refractive index

Waveguides

Fringe analysis

Planar waveguides

Diffusion

Ion exchange

Mach-Zehnder interferometers

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