26 February 2004 Fabrication and determination of refractive index profile of the planar waveguides by wedge technique
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Proceedings Volume 5252, Optical Fabrication, Testing, and Metrology; (2004); doi: 10.1117/12.503918
Event: Optical Systems Design, 2003, St. Etienne, France
Abstract
In this paper we will present determination of refractive index profile of an ion exchanged planar waveguide using wedge technique. The sample preparation, data analysis and experimental results will be presented.
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Seyed Mohammad Reza Sadat Hosseini, Ahmad Darudi, Mohammad Taghi Tavassoly, "Fabrication and determination of refractive index profile of the planar waveguides by wedge technique", Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); doi: 10.1117/12.503918; https://doi.org/10.1117/12.503918
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KEYWORDS
Refractive index

Waveguides

Fringe analysis

Planar waveguides

Diffusion

Ion exchange

Mach-Zehnder interferometers

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