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2 September 2003 Distributed control and measurement system (DCS) preferable to design-for-testability (DfT) for analog ICs
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Proceedings Volume 5253, Fifth International Symposium on Instrumentation and Control Technology; (2003) https://doi.org/10.1117/12.521989
Event: Fifth International Symposium on Instrumentation and Control Technology, 2003, Beijing, China
Abstract
A fast and efficient method for element-identification and Analog-DfT with the aid of ac Josephson voltages has been found from several papers listed in our references where specified terms Novel-Optimum-Identification (NOI) and Fast-Convergence-Identification (FCI) have been emphasized. Not only those issues in our DCS, the Controllability and Observability, but also the hazard-proof abilities vs the parasitic stray capacitive coupling anywhere especially inside each device in analog interface circuits have to be taken into consideration for our analog-DfT requirement. A computer program based on the method has been made and tested for its efficiency and capability.
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Guonan Zhao, Jianping Hu, Fuhong Zhang, and Linbin Cheng "Distributed control and measurement system (DCS) preferable to design-for-testability (DfT) for analog ICs", Proc. SPIE 5253, Fifth International Symposium on Instrumentation and Control Technology, (2 September 2003); https://doi.org/10.1117/12.521989
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