2 September 2003 Multisensor integrated automated inspection system
Author Affiliations +
Proceedings Volume 5253, Fifth International Symposium on Instrumentation and Control Technology; (2003); doi: 10.1117/12.521835
Event: Fifth International Symposium on Instrumentation and Control Technology, 2003, Beijing, China
It is a trend of modern measurement technology to combine the contact and non-contact measurement techniques together to realize a more efficient and high-precision inspection of manufactured products. Based on an analysis of existing optical inspection technologies and the merits and shortcomings of coordinate measuring machine (CMM) technique, we propose a multi-sensor automatic inspection system, which combines the coordinate measuring machine with non-contact optical measuring apparatus and can select automatically either of the two methods for different (simple-geometry or complex free-form) measured objects so as to raise the accuracy amd efficiency of measurement. The general planning and key components of the system are discussed.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huacheng Chen, Boxiong Wang, Xiuzhi Luo, Zhenjiang Liu, Jie Ding, Jiqiang Zhu, "Multisensor integrated automated inspection system", Proc. SPIE 5253, Fifth International Symposium on Instrumentation and Control Technology, (2 September 2003); doi: 10.1117/12.521835; https://doi.org/10.1117/12.521835


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