Paper
2 September 2003 The study of fast identifying methods on ECNT
Xiaoyun Sun, Donghui Liu, Nan Gao, Huiqin Sun, Jiann Sheng
Author Affiliations +
Proceedings Volume 5253, Fifth International Symposium on Instrumentation and Control Technology; (2003) https://doi.org/10.1117/12.521900
Event: Fifth International Symposium on Instrumentation and Control Technology, 2003, Beijing, China
Abstract
BP network is applied on ECNT (Eddy Current Nondestructive Testing) to identify defect fast in this paper. Due to BP network having the disadvantages of large numbers of iteration and local minimum values, authors use RBF network on ECNT. The results show that numbers of iteration using RBF network are reduced faster than using BP network, and it is possible to detect online by RBF network.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaoyun Sun, Donghui Liu, Nan Gao, Huiqin Sun, and Jiann Sheng "The study of fast identifying methods on ECNT", Proc. SPIE 5253, Fifth International Symposium on Instrumentation and Control Technology, (2 September 2003); https://doi.org/10.1117/12.521900
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KEYWORDS
Wavelets

Edge detection

Signal detection

Magnetism

Neurons

Wavelet transforms

Detection and tracking algorithms

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