26 February 2004 3D precision surface measurement by dynamic structured light
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Proceedings Volume 5265, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology; (2004) https://doi.org/10.1117/12.514442
Event: Photonics Technologies for Robotics, Automation, and Manufacturing, 2003, Providence, RI, United States
Abstract
This paper describes a 3-D imaging technique developed as an internal research project at Southwest Research Institute. The technique is based on an extension of structured light methods in which a projected pattern of parallel lines is rotated over the surface to be measured. A sequence of images is captured and the surface elevation at any location can then be determined from measurements of the temporal pattern, at any point, without considering any other points on the surface. The paper describes techniques for system calibration and surface measurement based on the method of projected quadric shells. Algorithms were developed for image and signal analysis and computer programs were written to calibrate the system and to calculate 3-D coordinates of points on a measured surface. A prototype of the Dynamic Structured Light (DSL) 3-D imaging system was assembled and typical parts were measured. The design procedure was verified and used to implement several different configurations with different measurement volumes and measurement accuracy. A small-parts measurement accuracy of 32 micrometers (.0012”) RMS was verified by measuring the surface of a precision-machined plane. Large aircraft control surfaces were measured with a prototype setup that provided .02” depth resolution over a 4’ by 8’ field of view. Measurement times are typically less than three minutes for 300,000 points. A patent application has been filed.
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Ernest A. Franke, Ernest A. Franke, Michael J. Magee, Michael J. Magee, Joseph N. Mitchell, Joseph N. Mitchell, Michael P. Rigney, Michael P. Rigney, "3D precision surface measurement by dynamic structured light", Proc. SPIE 5265, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology, (26 February 2004); doi: 10.1117/12.514442; https://doi.org/10.1117/12.514442
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