Ground-based imaging system for soil surface roughness measurement

Zhiling Long; Ping-Rey Jang; Jiann-Cherng Su; Yun Sun; J. Alex Thomasson; S.D. Filip To

doi:10.1117/12.515564

30 March 2004 Ground-based imaging system for soil surface roughness measurement

Zhiling Long, Ping-Rey Jang, Jiann-Cherng Su, Yun Sun, J. Alex Thomasson, S.D. Filip To

Proceedings Volume 5271, Monitoring Food Safety, Agriculture, and Plant Health; (2004) https://doi.org/10.1117/12.515564
Event: Optical Technologies for Industrial, Environmental, and Biological Sensing, 2003, Providence, RI, United States

Abstract

Surface roughness is an important physical property of soil in agricultural applications. It is a key parameter affecting the optical reflectance of bare soils, which can be computed from imagery acquired with airborne or space-based remotesensing devices. Accurate ground-truth roughness data need to be collected before a correct computational interpretation can be made. This paper presents the development of a real-time, geo-referenced, ground-based imaging system that produces quantitative ground truth information of soil surface roughness. The system applies Fourier transform profilometry (FTP) to an image of a soil area under study to obtain relative height data of the surface. Then it computes parameters such as root mean square (RMS) and correlation length as measures of roughness. Measurement experiments have been carried out successfully both under simulated conditions in the laboratory and in the field. The results show that the system is capable of generating reliable ground-truth soil surface roughness information. In comparison with other approaches, this developed system is fast, efficient and inexpensive.

Citation Download Citation

Zhiling Long, Ping-Rey Jang, Jiann-Cherng Su, Yun Sun, J. Alex Thomasson, and S.D. Filip To "Ground-based imaging system for soil surface roughness measurement", Proc. SPIE 5271, Monitoring Food Safety, Agriculture, and Plant Health, (30 March 2004); https://doi.org/10.1117/12.515564

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available