Size and complex index of nanocenters: optical measurements

Laurent Gallais; Philippe Voarino; Jean-Yves Natoli; Mireille Commandre; Claude Amra

doi:10.1117/12.524397

10 June 2004 Size and complex index of nanocenters: optical measurements

Laurent Gallais, Philippe Voarino, Jean-Yves Natoli, Mireille Commandre, Claude Amra

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Proceedings Volume 5273, Laser-Induced Damage in Optical Materials: 2003; (2004) https://doi.org/10.1117/12.524397
Event: XXXV Annual Symposium on Optical Materials for High Power Lasers: Boulder Damage Symposium, 2003, Boulder, Colorado, United States

Abstract

Non destructive detection, localization and characterization of nanocenters today remains a challenge for investigation of laser-induced damage in optical materials. In this study we propose an attempt to reach this aim via optical techniques, and extract size and complex index of nanocenters. The procedure is described and results are given for SiO₂ thin film samples. All conclusions are discussed in regard to assumptions.

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Laurent Gallais, Philippe Voarino, Jean-Yves Natoli, Mireille Commandre, and Claude Amra "Size and complex index of nanocenters: optical measurements", Proc. SPIE 5273, Laser-Induced Damage in Optical Materials: 2003, (10 June 2004); https://doi.org/10.1117/12.524397

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