Translator Disclaimer
10 June 2004 Size and complex index of nanocenters: optical measurements
Author Affiliations +
Abstract
Non destructive detection, localization and characterization of nanocenters today remains a challenge for investigation of laser-induced damage in optical materials. In this study we propose an attempt to reach this aim via optical techniques, and extract size and complex index of nanocenters. The procedure is described and results are given for SiO2 thin film samples. All conclusions are discussed in regard to assumptions.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Laurent Gallais, Philippe Voarino, Jean-Yves Natoli, Mireille Commandre, and Claude Amra "Size and complex index of nanocenters: optical measurements", Proc. SPIE 5273, Laser-Induced Damage in Optical Materials: 2003, (10 June 2004); https://doi.org/10.1117/12.524397
PROCEEDINGS
9 PAGES


SHARE
Advertisement
Advertisement
Back to Top