Paper
12 May 2004 Commercialization of VCSELs and VCSEL arrays
Karlheinz Gulden, Yu Gao, Paul Royo, Marcel Brunner
Author Affiliations +
Proceedings Volume 5280, Materials, Active Devices, and Optical Amplifiers; (2004) https://doi.org/10.1117/12.521151
Event: Asia-Pacific Optical and Wireless Communications, 2003, Wuhan, China
Abstract
Various aspects relevant for the commerzialization of VCSELs used in data communications and sensor applications are discussed. In particular, reliability results obtained on selective oxide VCSELs and production reliability assurance procedures are discussed. For typical operating conditions of 50°C and 6 mA we obtain a time to 1% failure of 1.7 Million hours.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karlheinz Gulden, Yu Gao, Paul Royo, and Marcel Brunner "Commercialization of VCSELs and VCSEL arrays", Proc. SPIE 5280, Materials, Active Devices, and Optical Amplifiers, (12 May 2004); https://doi.org/10.1117/12.521151
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Vertical cavity surface emitting lasers

Reliability

Semiconducting wafers

Oxides

Failure analysis

Data modeling

Data communications

RELATED CONTENT

28 Gb/s 850 nm oxide VCSEL development at Avago
Proceedings of SPIE (March 13 2013)
Highly reliable oxide VCSELs for datacom applications
Proceedings of SPIE (June 17 2003)
New developments in 850 and 1300nm VCSELs at JDSU
Proceedings of SPIE (February 06 2009)
Reliability of oxide VCSELs at Emcore
Proceedings of SPIE (June 16 2004)

Back to Top