25 September 2003 Multifractal-based edge detection
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Proceedings Volume 5286, Third International Symposium on Multispectral Image Processing and Pattern Recognition; (2003) https://doi.org/10.1117/12.538852
Event: Third International Symposium on Multispectral Image Processing and Pattern Recognition, 2003, Beijing, China
Abstract
In this paper, an approach of edge detection based-on multifractal is proposed. We apply the 2D wavelet transform modulus maxima (WTMM) method to characterize pointwise Holder regularity and the multifractal spectrum, so edge information can be extracted directly from them. Experiment results demonstrate that multifractal based edge detection has strong flexibility and good detection effect.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wen Yang, Wen Yang, Hong Sun, Hong Sun, Xin Xu, Xin Xu, "Multifractal-based edge detection", Proc. SPIE 5286, Third International Symposium on Multispectral Image Processing and Pattern Recognition, (25 September 2003); doi: 10.1117/12.538852; https://doi.org/10.1117/12.538852
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