28 May 2004 ALP: universal DMD controller for metrology and testing
Author Affiliations +
Abstract
The paper presents a current development in the field of high-speed spatial light modulators. The Digital Micromirror Device (DMD) developed and produced by Texas Instruments Inc. (TI) stimulated new approaches in photonics. Recently, TI introduced the Discovery general purpose chipset to support new business areas in addition to the mainstream application of DMD technology in digital projection. ViALUX developed the ALP parallel interface controller board as a Discovery 1100 accessory for high speed micromirror operation. ALP (Accessory Light Modulator Package) has been designed for use in optical metrology but is widely open for numerous applications. It allows for rapid launch into new DMD applications and can be integrated instantly into existing systems or may initiate new developments. The paper describes both, the general hardware architecture and the software concept of the new high-speed controller solution. Binary and gray-value patterns of variable bit-depth can be pre-loaded to on-board SDRAM via USB and transferred to DMD at high speed (up to 6900 XGA frames per second). Three examples are to illustrate how the approach enables advanced applications of DMD technology in metrology, testing and beyond.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roland Hoefling, Enrico Ahl, "ALP: universal DMD controller for metrology and testing", Proc. SPIE 5289, Liquid Crystal Materials, Devices, and Applications X and Projection Displays X, (28 May 2004); doi: 10.1117/12.528336; https://doi.org/10.1117/12.528336
PROCEEDINGS
8 PAGES


SHARE
KEYWORDS
Digital micromirror devices

Aluminium phosphide

Interfaces

Cameras

Field programmable gate arrays

Binary data

Metrology

RELATED CONTENT

Advanced optical 3D scanners using DMD technology
Proceedings of SPIE (February 20 2017)
High-speed 3D imaging by DMD technology
Proceedings of SPIE (May 03 2004)
MicroScan: a DMD-based optical surface profiler
Proceedings of SPIE (October 24 2000)
Hadamard camera for 3D imaging
Proceedings of SPIE (October 06 2007)

Back to Top