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16 April 2004 Real metrology by using depth map information
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Proceedings Volume 5302, Three-Dimensional Image Capture and Applications VI; (2004)
Event: Electronic Imaging 2004, 2004, San Jose, California, United States
Usually in an image no real information about the scene’s depth (in terms of absolute distance) is available. In this paper, a method that extracts real depth measures is developed. This approach starts considering a region located in the center of the depth map. This region can be positioned, interactively, in any part of the depth map in order to measure the real distance of every object inside the scene. The histogram local maxima of this region are determined. Among these values the biggest, that represents the gray-level of the most considerable object, is chosen. This gray-level is used in an exponential mapping function that converts, using the input camera settings, the depth map gray-levels into real measures. Experiments over a large dataset of images show good performances in terms of accuracy and reliability.
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Edoardo Ardizzone, Sebastiano Battiato, Alessandro Capra, and Salvatore Curti "Real metrology by using depth map information", Proc. SPIE 5302, Three-Dimensional Image Capture and Applications VI, (16 April 2004);

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