Paper
13 July 2004 Error analysis and tolerance allocation for confocal scanning microscopy using the Monte Carlo method
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Abstract
The errors can cause the serious loss of the performance of a precision machine system. In this paper, we propose the method of allocating the alignment tolerances of the components and apply this method to Confocal Scanning Microscopy (CSM) to get the optimal tolerances. CSM uses confocal aperture, which blocks the out-of-focus information. Thus, it provides images with superior resolution and has unique property of optical sectioning. Recently, due to these properties, it has been widely used for measurement in biological field, medical science, material science and semiconductor industry. In general, tight tolerances are required to maintain the performance of a system, but a high cost of manufacturing and assembling is required to preserve the tight tolerances. The purpose of allocating the optimal tolerances is minimizing the cost while keeping the performance of the system. In the optimal problem, we set the performance requirements as constraints and maximized the tolerances. The Monte Carlo Method, a statistical simulation method, is used in tolerance analysis. Alignment tolerances of optical components of the confocal scanning microscopy are optimized, to minimize the cost and to maintain the observation performance of the microscopy. We can also apply this method to the other precision machine system.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hongki Yoo, Dong-Kyun Kang, SeungWoo Lee, Junhee Lee, and Dae-Gab Gweon "Error analysis and tolerance allocation for confocal scanning microscopy using the Monte Carlo method", Proc. SPIE 5324, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI, (13 July 2004); https://doi.org/10.1117/12.529942
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Cited by 1 scholarly publication.
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KEYWORDS
Tolerancing

Confocal microscopy

Error analysis

Monte Carlo methods

Microscopy

Manufacturing

Assembly tolerances

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