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13 July 2004 Three-dimensional imagery using multiple nanometric probes
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Abstract
We present a high-resolution imaging technique using nanometric beads as multiple scattering local probes. The positions of the beads are determined in three dimensions by white-light interference microscopy. The technique has been applied to study the deformation of gels under mechanical constraint. The location of Brownian moving beads has also been demonstrated with nanometer spatial precision and 10 μs acquisition time. High-resolution 3-D imaging of hollow structures explored by the beads in relatively transparent materials should be possible.
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Gael Moneron, Arnaud Dubois, and Albert-Claude Boccara "Three-dimensional imagery using multiple nanometric probes", Proc. SPIE 5324, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI, (13 July 2004); doi: 10.1117/12.529274; https://doi.org/10.1117/12.529274
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