1 June 2004 Diode array reliability experiment
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Proceedings Volume 5336, High-Power Diode Laser Technology and Applications II; (2004) https://doi.org/10.1117/12.537448
Event: Lasers and Applications in Science and Engineering, 2004, San Jose, Ca, United States
Abstract
The reliability, long-term performance and lifetime of high power diode arrays are important issues for pumping of solid state and fiber laser systems. Operation of high power arrays in these systems has resulted in greater degradation rates than the reported lifetime data. We report on lifetime testing of a commercial high power array using an automated diode array reliability experiment. This computer controlled setup operates the laser array 24 hours a day in a cyclical format of 10 minutes on and one minute off. The array currently being tested was operated for more than 2500 hours at which time it experienced a sudden drop in power. Analysis of the array and the data suggest that the micro channel coolers corroded and that a sudden plugging of one or more channels caused the failure.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David J. Gallant, David J. Gallant, } "Diode array reliability experiment", Proc. SPIE 5336, High-Power Diode Laser Technology and Applications II, (1 June 2004); doi: 10.1117/12.537448; https://doi.org/10.1117/12.537448
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