1 June 2004 Polarization state effects in third-harmonic generation with applications in microscopy and ultrashort pulse measurement
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Proceedings Volume 5340, Commercial and Biomedical Applications of Ultrafast Lasers IV; (2004) https://doi.org/10.1117/12.528284
Event: Lasers and Applications in Science and Engineering, 2004, San Jose, Ca, United States
Abstract
We show that a simple plane wave analysis can be used even under tight focusing conditions to predict the dependence of third-harmonic generation on the polarization state of the incident beam. Exploiting this fact, we then show that circularly polarized beams may be used to spatially characterize the beam focus and temporally characterize ultrashort pulses in high numerical aperture systems by experimentally demonstrating, for the first time, novel collinear, background-free, third-harmonic intensity autocorrelations in time and space in a high numerical aperture microscope.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David N. Fittinghoff, Virginijus Barzda, Jeffrey A Squier, Juerg Aus der Au, "Polarization state effects in third-harmonic generation with applications in microscopy and ultrashort pulse measurement", Proc. SPIE 5340, Commercial and Biomedical Applications of Ultrafast Lasers IV, (1 June 2004); doi: 10.1117/12.528284; https://doi.org/10.1117/12.528284
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