Paper
25 June 2004 Refraction indexes of the polyester film 3M PP2500
Mauricio Ortiz-Gutierrez, Marco Antonio Salgado V., Aaron Moises Martinez-Basurto, Arturo Olivares-Perez, Jose Luis Juarez-Perez, Mario Perez-Cortes, Juan Carlos Ibarra-Torres
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Abstract
In this work we describe an experimental technique to measure the refraction index of the 3M PP2500 film which has good behavior as quarter wave retarder plate for λ=633 nm. This technique is achieved when two perpendicular linearly polarized beam from a Wollaston prism are incident on the thickness of the film. The beams were incident parallel to the fast axis to measure the ordinary refraction index and parallel to the slow axis to measure the extraordinary refraction index. Some experimental results are shown.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mauricio Ortiz-Gutierrez, Marco Antonio Salgado V., Aaron Moises Martinez-Basurto, Arturo Olivares-Perez, Jose Luis Juarez-Perez, Mario Perez-Cortes, and Juan Carlos Ibarra-Torres "Refraction indexes of the polyester film 3M PP2500", Proc. SPIE 5363, Emerging Optoelectronic Applications, (25 June 2004); https://doi.org/10.1117/12.528078
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Cited by 2 scholarly publications.
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KEYWORDS
Wave plates

Refractive index

Polarization

Prisms

Helium neon lasers

Beam propagation method

Crystals

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