25 June 2004 Refraction indexes of the polyester film 3M PP2500
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In this work we describe an experimental technique to measure the refraction index of the 3M PP2500 film which has good behavior as quarter wave retarder plate for λ=633 nm. This technique is achieved when two perpendicular linearly polarized beam from a Wollaston prism are incident on the thickness of the film. The beams were incident parallel to the fast axis to measure the ordinary refraction index and parallel to the slow axis to measure the extraordinary refraction index. Some experimental results are shown.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mauricio Ortiz-Gutierrez, Mauricio Ortiz-Gutierrez, Marco Antonio Salgado V., Marco Antonio Salgado V., Aaron Moises Martinez-Basurto, Aaron Moises Martinez-Basurto, Arturo Olivares-Perez, Arturo Olivares-Perez, Jose Luis Juarez-Perez, Jose Luis Juarez-Perez, Mario Perez-Cortes, Mario Perez-Cortes, Juan Carlos Ibarra-Torres, Juan Carlos Ibarra-Torres, "Refraction indexes of the polyester film 3M PP2500", Proc. SPIE 5363, Emerging Optoelectronic Applications, (25 June 2004); doi: 10.1117/12.528078; https://doi.org/10.1117/12.528078


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