16 June 2004 Reliability of oxide VCSELs at Emcore
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Recent data on 10 Gb/s oxide VCSELs are presented. We cover failure analysis results on VCSELs that failed in the field, including failures due to electrostatic discharge (ESD) and those inherent to the limitations of the present mesa structure used in oxide VCSELs. An ongoing experiment to overcome these limitations is discussed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christopher J. Helms, Ian Aeby, Wenlin Luo, Robert W Herrick, Albert Yuen, "Reliability of oxide VCSELs at Emcore", Proc. SPIE 5364, Vertical-Cavity Surface-Emitting Lasers VIII, (16 June 2004); doi: 10.1117/12.539282; https://doi.org/10.1117/12.539282


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