29 April 2004 Propagation of APC models across product boundaries
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The BCT solution is an automatic correction for systematic offset built into the PCS product based on calibration from 2-5 wafers. This paper explores the validity of a predictive model for process control for use by manufacturers of semiconductor devices with a multitude of products or part numbers. The proposed model defines the parameters of interests as a function of the film stack, tool attributes, and mask characteristics. The paper proposes a process for model development that dramatically reduces the cost of materials, tool time, and engineering effort.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tito Chowdhury, Tito Chowdhury, Mark Freeland, Mark Freeland, Ole Krogh, Ole Krogh, Geethakrishnan Narasimhan, Geethakrishnan Narasimhan, Gayathri Raghavendra, Gayathri Raghavendra, } "Propagation of APC models across product boundaries", Proc. SPIE 5378, Data Analysis and Modeling for Process Control, (29 April 2004); doi: 10.1117/12.536454; https://doi.org/10.1117/12.536454


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