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Laser system for accuracy determining of the coordinates of an object on a ground veiled for direct view
Characterization of pyroelectric materials for uncooled infrared sensors in dielectric bolometer mode: specific features and setup
Refraction's slacking in optoelectronic systems for positioning of elements of ecologically dangerous objects
Reflectance for an approximately one-dimensional rough surface that has rms roughness greater than a wavelength
Analyzer of space-time structure of semiconductor laser radiation on the basis of photomultiplier tube in phase detection mode
Phase anisotropy measurements in multilayer dielectric laser mirrors during their manufacture process and corrections introduced in the produced lasers
Computerization of contact white light interferometers for linear measurements with submicrometer resolution