Paper
19 February 2004 Refraction's slacking in optoelectronic systems for positioning of elements of ecologically dangerous objects
Sviatoslav M. Latyev, Ernst D. Pankov, Alexander V. Prokofjev, Alexander N. Tymofeev
Author Affiliations +
Proceedings Volume 5381, Lasers for Measurements and Information Transfer 2003; (2004) https://doi.org/10.1117/12.547684
Event: Lasers for Measurements and Information Transfer 2003, 2003, St. Petersburg, Russian Federation
Abstract
In this work the model of the optoelectronic measuring system with an optical equisignal zone using a two-wavelength spectral method for compensation of atmosphere refraction's influence in land stratum is considered. The optical and electrical scheme of the model, and also equations describing process of a measurement and compensation refraction's influence is resulted. These stated materials produce the model of such system.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sviatoslav M. Latyev, Ernst D. Pankov, Alexander V. Prokofjev, and Alexander N. Tymofeev "Refraction's slacking in optoelectronic systems for positioning of elements of ecologically dangerous objects", Proc. SPIE 5381, Lasers for Measurements and Information Transfer 2003, (19 February 2004); https://doi.org/10.1117/12.547684
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Cited by 2 scholarly publications.
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KEYWORDS
Light emitting diodes

Refraction

Modulation

Atmospheric modeling

Power supplies

Atmospheric optics

Infrared radiation

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