19 February 2004 Refraction's slacking in optoelectronic systems for positioning of elements of ecologically dangerous objects
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Proceedings Volume 5381, Lasers for Measurements and Information Transfer 2003; (2004) https://doi.org/10.1117/12.547684
Event: Lasers for Measurements and Information Transfer 2003, 2003, St. Petersburg, Russian Federation
Abstract
In this work the model of the optoelectronic measuring system with an optical equisignal zone using a two-wavelength spectral method for compensation of atmosphere refraction's influence in land stratum is considered. The optical and electrical scheme of the model, and also equations describing process of a measurement and compensation refraction's influence is resulted. These stated materials produce the model of such system.
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Sviatoslav M. Latyev, Sviatoslav M. Latyev, Ernst D. Pankov, Ernst D. Pankov, Alexander V. Prokofjev, Alexander V. Prokofjev, Alexander N. Tymofeev, Alexander N. Tymofeev, } "Refraction's slacking in optoelectronic systems for positioning of elements of ecologically dangerous objects", Proc. SPIE 5381, Lasers for Measurements and Information Transfer 2003, (19 February 2004); doi: 10.1117/12.547684; https://doi.org/10.1117/12.547684
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