27 July 2004 Self-assembled nanostructured sensors
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Abstract
We report the development of nanostructured strain sensors formed by electrostatic self-assembly (ESA) processing. The sensors may be used to measure strains from 1 microstrain to more than 100% strain, over gauge lengths ranging from approximately 1 millimeter to tens of centimeters.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. H. Lalli, A. Hill, S. Hannah, S. Subrahmanyan, M. Bortner, J. Mecham, B. Davis, R. Goff, Richard O. Claus, "Self-assembled nanostructured sensors", Proc. SPIE 5384, Smart Structures and Materials 2004: Smart Sensor Technology and Measurement Systems, (27 July 2004); doi: 10.1117/12.539843; https://doi.org/10.1117/12.539843
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