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21 July 2004 NDE of microstructured materials by x-ray diffraction and refraction topography
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For the purpose of micro structural characterization X-ray topography reveals the spatially resolved scattering of materials and small components. It combines the advantages of radiographic imaging and the analytical information of wide and small angle X-ray scattering like phase distribution, texture, micro cracks, interfaces and pores. Scanning techniques at selected scattering conditions permit the topographic characterization of any crystalline or amorphous solid or liquid. Topographic methods and applications for the purposes of research, quality control and damage evaluation are presented.
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Manfred P. Hentschel, Axel Lange, K.-Wolfram Harbich, Joerg Schors, Oliver Wald, and Bernd R. Mueller "NDE of microstructured materials by x-ray diffraction and refraction topography", Proc. SPIE 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II, (21 July 2004);

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