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5 April 2004 On the determination of the stray field structure by magnetic force microscopy (MFM)
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Abstract
In this paper the influence of work parameter of magnetic force microscopy (MFM) on the magnetic contrast of the stray field measured in soft magnetic amorphous Fe-based ribbons using two-pass technique has been analyzed. It was proved that an increase in ΔZ separation of sample-tip during the second scan affects considerably the quality, contrast of obtained micrograph of the stray field image. Increase in &ΔZ causes smaller interaction between the cantilever's tip and tested field. It is caused by smaller influence of the source field emitted from the sample on the magnetic tip. Detirioration and contrast's broadening of obtained pictures allows to analyze and detect the areas which have positive as well as negative magnetization.
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Teodor M. Breczko and Miroslaw Bramowicz "On the determination of the stray field structure by magnetic force microscopy (MFM)", Proc. SPIE 5400, Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (5 April 2004); https://doi.org/10.1117/12.555374
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