5 April 2004 Study of stress gradients using computer simulation of diffraction data
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Abstract
Difficulties of determination of surface stress gradients using X-ray diffraction technique are connected with interpretation of non-linearity of θφ,ψ versus sin2ψ experimental curves. The problem is that the scattering of experimental data conceals a non-linear character of sin2ψ dependency and does not allow to determine correctly the parameters of stress gradient. The solution of this problem can be resolved experimentally by stress analysis of a sample with known parameters of stress gradients or by computer simulation of a diffraction profile created by surface layers with stress gradient. The first is not successful because of the difficulty to make the samples with the known parameters of stress gradient. The second is more productive because it allows to simulate an experimental θφ,ψ versus sin2ψ dependency and to obtain the relationships between stress gradient parameters and non-linearity of sin2ψ plots. Computer simulation of diffraction data presented in this paper permits also to analyze directly the broadening of diffraction line caused by stress gradient.
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Joaquim T. de Assis, Vladimir I. Monin, Sergei A. Filippov, Antonio Merendaz, "Study of stress gradients using computer simulation of diffraction data", Proc. SPIE 5400, Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (5 April 2004); doi: 10.1117/12.555459; https://doi.org/10.1117/12.555459
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