28 May 2004 Research of optical and structural properties in multilayer films (Ni22ACo75A) x20L
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Proceedings Volume 5401, Micro- and Nanoelectronics 2003; (2004) https://doi.org/10.1117/12.562652
Event: Micro- and Nanoelectronics 2003, 2003, Zvenigorod, Russian Federation
In this work results of investigated films (Ni22ACo75A) x20L are submitted on the basis of which it is possible to say about their use as sensor systems in magnetic fields with the certain magnetization. Results of researches have shown structure of interfaces in volume of a film under influence of external factors and observable huge magnetic contrast in measurements of intensity of second harmonic generation. It was obtained out-of-plane anisotropy signal by means of simple magnetooptical Kerr effect techniques, which explaining by existence of uniaxial anisotropy, which is connected with the general direction of magnetization of domains in volume of film.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Bauhuis, G. Bauhuis, J. Gerristen, J. Gerristen, A. Keen, A. Keen, H. von Kempen, H. von Kempen, A. Matvienko, A. Matvienko, A. Ostroukhova, A. Ostroukhova, A. Pogorely, A. Pogorely, Theo Rasing, Theo Rasing, } "Research of optical and structural properties in multilayer films (Ni22ACo75A) x20L", Proc. SPIE 5401, Micro- and Nanoelectronics 2003, (28 May 2004); doi: 10.1117/12.562652; https://doi.org/10.1117/12.562652


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