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15 September 2004 Synthesis and characterization of high-energy nanoparticles
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Abstract
Atomic force microscopy (AFM), scanning electron microscopy (SEM), white light imaging measurements, and Raman microscopy were employed for the characterization of RDX nanoparticles deposited on glass substrate surfaces. The RDX nanoparticles were prepared by exposure of glass substrate surfaces to an aerosol jet containing RDX. The spectroscopic signature of RDX particles and the two known forms of the material, β and α RDX, are compared. Raman measurements reveal that RDX nanoparticles and β deposits have similar spectroscopic signatures between 750 and 1000 cm-1.
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Perla M. Torres, Lewis Mortimer Gomez, Samuel P. Hernandez-Rivera, Richard T. Lareau, R. Thomas Chamberlain, and Miguel E. Castro-Rosario "Synthesis and characterization of high-energy nanoparticles", Proc. SPIE 5403, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense III, (15 September 2004); https://doi.org/10.1117/12.542859
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