30 August 2004 Advanced large-format InSb IR FPA maturation at CMC Electronics
Author Affiliations +
CMC Electronics Cincinnati (CMC) is now in production on 1Kx1K InSb focal plane arrays (FPAs), and continuing efforts on a third production run of 2Kx2K large format IR FPAs. These FPAs are based on our unique reticulated InSb architecture which has been shown to be inherently scalable across format size without losing performance properties. Current offerings range from 256x256 to 2Kx2K formats ranging in between 30um and 20um pixel pitch, with 15um pixel pitch FPAs in development. Performance in the 10mk to 15mk NETD range will be shown. The design and fabrication of these advanced FPAs has challenged the state of the art in fabrication processing of both InSb detectors and silicon ROICs. Improvements made to enable large format fabrication have improved the yields and lowered the cost of smaller format FPAs as well. Program sponsored manufacturing improvement activities, as well as CMC internal R&D, continue to improve both the yields and the performance characteristics of these large arrays. This has resulted in breakthroughs in FPA size, performance, reliability and yeilds. The latest yield, operability, and performance data will be shown. Data will be drawn from a population of approximately 30 2K FPAs and 50 1K FPAs. Recent developments in smaller pixel pitch and other R&D areas will be discussed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rich Rawe, Rich Rawe, A. Timlin, A. Timlin, Mike Davis, Mike Davis, John W. Devitt, John W. Devitt, Mark Greiner, Mark Greiner, } "Advanced large-format InSb IR FPA maturation at CMC Electronics", Proc. SPIE 5406, Infrared Technology and Applications XXX, (30 August 2004); doi: 10.1117/12.542699; https://doi.org/10.1117/12.542699


QWIPs at IRnova, a status update
Proceedings of SPIE (May 19 2016)
Advanced FPA technology development at CMC Electronics
Proceedings of SPIE (October 20 2004)
Sensor bus cost of ownership investigation
Proceedings of SPIE (September 15 1994)
State of the art of mass production challenges for...
Proceedings of SPIE (April 14 2008)
State of the art in large format IR FPA development...
Proceedings of SPIE (October 09 2003)
Focal plane detectors for the WISE 12 and 23...
Proceedings of SPIE (September 18 2007)

Back to Top