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5 August 2004 Benefits of microscan for staring infrared imagers
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Imagers based on focal plane arrays (FPA) risk introducing in-band and out-of-band spurious response, or aliasing, due to undersampling. This can make high-level discrimination tasks such as recognition and identification much more difficult. To overcome this problem, three-chip color charge coupled device (CCD) cameras typically offset one CCD by 1/2 pixel with respect to the other two. Analogously, monochrome imagers including infrared can use microscan (or dither) to reduce aliasing. This paper describes a generic microscan technique and benefits of microscanning. Covered are analysis and experiments on four-point microscan employed in infrared imagers, in which the image is mechanically shifted by 1/2 pixel between fields, in each dimension. Four of these offset fields are then combined to form one frame of high-resolution video. We show that microscan reduces aliasing, which results in higher resolution and improved image quality resulting in improved performance.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John Lester Miller and John M. Wiltse "Benefits of microscan for staring infrared imagers", Proc. SPIE 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV, (5 August 2004);

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