Wavefront measurement by using photonic crystals

Hua Tong; Alastair D. McAulay

doi:10.1117/12.542889

3 August 2004 Wavefront measurement by using photonic crystals

Hua Tong, Alastair D. McAulay

Proceedings Volume 5435, Enabling Photonic Technologies for Aerospace Applications VI; (2004) https://doi.org/10.1117/12.542889
Event: Defense and Security, 2004, Orlando, Florida, United States

Abstract

This paper presents a novel method of wavefront measurement for adaptive optic systems by using a photonic crystal. In adaptive optics the wavefront shape of the incident wave is measured and used to set a reconfigurable mirror array to compensate for the aberration, reduce distortion and improve image and beam quality. In a 2D approach, the tilted wavefront at each pixel enters a V-shape structure of waveguides in a photonic crystal. By measuring and comparing the output power in the two waveguides, we can determine the tilted angle of the incident light at that pixel. This method can also be applied in a 3D approach.

Citation Download Citation

Hua Tong and Alastair D. McAulay "Wavefront measurement by using photonic crystals", Proc. SPIE 5435, Enabling Photonic Technologies for Aerospace Applications VI, (3 August 2004); https://doi.org/10.1117/12.542889

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