Paper
7 April 2004 Properties of erbium-doped gallium nitride films prepared by RF magnetron sputtering
Vaclav Prajzler, Ivan Huttel, Vratislav Perina, Josef Schrofel, Jarmila Spirkova, Jiri Oswald, Vaclav Studnicka, Miroslava Novotna
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Proceedings Volume 5445, Microwave and Optical Technology 2003; (2004) https://doi.org/10.1117/12.560666
Event: Microwave and Optical Technology 2003, 2003, Ostrava, Czech Republic
Abstract
We report on fabrication of the GaN layers deposited onto silicon, silica-on-silicon and quartz glass substrates by RF magnetron sputtering. The GaN layers were also doped with erbium ions to achieve active optical properties. The fabricated layers were characterized by a number of methods and the results are discussed on the bases of quality of the deposited GaN structures.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vaclav Prajzler, Ivan Huttel, Vratislav Perina, Josef Schrofel, Jarmila Spirkova, Jiri Oswald, Vaclav Studnicka, and Miroslava Novotna "Properties of erbium-doped gallium nitride films prepared by RF magnetron sputtering", Proc. SPIE 5445, Microwave and Optical Technology 2003, (7 April 2004); https://doi.org/10.1117/12.560666
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