Paper
20 August 2004 Evaluation of image placement of EPL stencil masks
Satoshi Yusa, Mikio Ishikawa, Yoshinori Kinase, Tadahiko Takikawa, Hiroshi Fujita, Hisatake Sano, Morihisa Houga, Naoya Hayashi
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Abstract
200-mm stencil masks for electron beam projection lithography (EPL) have been developed. Since they are not so rigid as photomasks because of their structure, 200-mm wafers with about 8,000 membrane windows, new metrological techniques dedicated to stencil masks have be introduced. Image placement (IP) accuracy of an EPL mask is evaluated with a suspension-type electrostatic chuck introduced to a Leica LMS IPRO. The dynamic repeatability of global IP measurements was 27 nm (3σ). It was confirmed that global IP errors were reduced to 60 nm (3σ, max) by linear-term and gravity corrections.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Satoshi Yusa, Mikio Ishikawa, Yoshinori Kinase, Tadahiko Takikawa, Hiroshi Fujita, Hisatake Sano, Morihisa Houga, and Naoya Hayashi "Evaluation of image placement of EPL stencil masks", Proc. SPIE 5446, Photomask and Next-Generation Lithography Mask Technology XI, (20 August 2004); https://doi.org/10.1117/12.557774
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KEYWORDS
Photomasks

Distortion

Data corrections

Semiconducting wafers

Data processing

Image analysis

Electron beam lithography

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