16 February 2005 Measuring systems based on a two-wavelength semiconductor lasers
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Proceedings Volume 5447, Lasers for Measurements and Information Transfer 2004; 54470E (2005) https://doi.org/10.1117/12.610497
Event: Lasers for Measurements and Information Transfer 2004, 2004, St. Petersburg, Russian Federation
Abstract
Semiconductor laser diodes the based on unsymmetrical structural quantum-well heterostructures are capable to emit optical radiation simultaneously on two or three wavelengths with determinated amplitude and pulse repetition frequency in gigahertz range. Occurrence of multifrequency lasers gives wide opportunities for making highly effective two-wavelength laser measuring and the analyzer systems of new type, which provides essential advantages before analogous one-wavelength laser systems.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir L. Kozlov, Vladimir L. Kozlov, "Measuring systems based on a two-wavelength semiconductor lasers", Proc. SPIE 5447, Lasers for Measurements and Information Transfer 2004, 54470E (16 February 2005); doi: 10.1117/12.610497; https://doi.org/10.1117/12.610497
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