16 February 2005 Application of the scattering screen for the automated measurements of spatial-power characteristics of radiation of semiconductor lasers
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Proceedings Volume 5447, Lasers for Measurements and Information Transfer 2004; 54470K (2005) https://doi.org/10.1117/12.610580
Event: Lasers for Measurements and Information Transfer 2004, 2004, St. Petersburg, Russian Federation
Abstract
In the given article the use of scattering screens is offered as intermediate sourcs of radiation at measurements of spatial-power parameters wide-aperture optical bunches. It is shown, that in bidimensional statement of a problem, the reduction from experimental values of distribution of a radiation stream to angular distribution of power force of light is possible at the set angular dependence of factor diffusive transmission or reflections of the scattering screen and known geometric-optical parameters of measuring unit.
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A. V. Grishanov, A. V. Grishanov, V. N. Grishanov, V. N. Grishanov, } "Application of the scattering screen for the automated measurements of spatial-power characteristics of radiation of semiconductor lasers", Proc. SPIE 5447, Lasers for Measurements and Information Transfer 2004, 54470K (16 February 2005); doi: 10.1117/12.610580; https://doi.org/10.1117/12.610580
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