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20 September 2004 Ionization mechanisms in dielectrics irradiated by femtosecond laser pulses (Poster Award Paper)
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Proceedings Volume 5448, High-Power Laser Ablation V; (2004)
Event: High-Power Laser Ablation, 2004, Taos, New Mexico, United States
In order to investigate the ultrafast dynamics of free carriers generated in bulk dielectrics by intense femtosecond laser pulses we have designed a setup for ultrafast time-resolved imaging Mach-Zehnder interferometry. The application of the 2D-Fourier-transform technique allows us to accurately reconstruct the actual laser-induced phase shifts and transmission changes for the probe pulses, which provide the properties of free carriers. Interferometric measurements in high-purity fused silica clearly demonstrate that the dominant ionization mechanism for intensities below 10 TW/cm2 is multiphoton ionization.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vasily V. Temnov, Klaus Sokolowski-Tinten, Ping Zhou, Barbel Rethfeld, Vitaly E. Gruzdev, Abd-Allah El-Khamawy, and Dietrich von der Linde "Ionization mechanisms in dielectrics irradiated by femtosecond laser pulses (Poster Award Paper)", Proc. SPIE 5448, High-Power Laser Ablation V, (20 September 2004);

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