Recent advancements in digital holographic microscopy and its applications

Pietro Ferraro; Giuseppe Coppola; Domenico Alfieri; Sergio De Nicola; Andrea Finizio; Giovanni Pierattini

doi:10.1117/12.554755

10 September 2004 Recent advancements in digital holographic microscopy and its applications

Pietro Ferraro, Giuseppe Coppola, Domenico Alfieri, Sergio De Nicola, Andrea Finizio, Giovanni Pierattini

Proceedings Volume 5457, Optical Metrology in Production Engineering; (2004) https://doi.org/10.1117/12.554755
Event: Photonics Europe, 2004, Strasbourg, France

Abstract

Digital holograms recorded with a charge coupled device camera array are numerically reconstructed in amplitude and phase through calculation of the Fresnel-Kirchhoff integral. The flexibility offered by the reconstruction process in digital holography allows exploitation of new possibilities of application in microscopy. Through the reconstruction process we will show that it is possible to control image parameters as focus distance, image size and image resolution. We report on recent developments obtained in the numerical reconstruction process of holograms. Novel prospective of application of digital holography in single and multi-wavelengths operation either for display and metrological applications can be explored by those recent achievements. Examples of applications of digital holographic microscopy for characterizing silicon MEMS structures by adopting new procedures are illustrated and discussed.

Citation Download Citation

Pietro Ferraro, Giuseppe Coppola, Domenico Alfieri, Sergio De Nicola, Andrea Finizio, and Giovanni Pierattini "Recent advancements in digital holographic microscopy and its applications", Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); https://doi.org/10.1117/12.554755

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