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17 August 2004 Sensitivity-tunable interferometric system based on surface plasmon resonance
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Abstract
We present an improved interferometric system based on surface plasmon resonance (SPR) and phase detection. The system incorporates a SPR device and a total internal reflection (TIR) device used not only to enhance the relative phase-shift between the TE and TM waves but also to keep the output beam to be anti-parallel to the input beam. A pair of quarter-wave-plates (QWPs) is placed in front of and behind, respectively, to the system. This gives rise to optimize the response curve and then the sensitivity. Theoretical simulations have been developed and verified by experimental results. By using this new design, we can always get the best sensitivity regardless weather the systems are manufactured in perfect conditions or not.
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Chien-Ming Wu and Ming-Chi Pao "Sensitivity-tunable interferometric system based on surface plasmon resonance", Proc. SPIE 5458, Optical Micro- and Nanometrology in Manufacturing Technology, (17 August 2004); https://doi.org/10.1117/12.545327
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