Paper
17 August 2004 Study of the roughness and optical near field of mass surface by using a SNOM with shear-force regulation
Youssef Haidar, Frederique de Fornel, Chouki Zerouki, Patrick Pinot
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Abstract
In mass metrology, the stability of weights, such as standard kilograms, has always been a major concern. Models have been used to describe the various factors that affect mass stability. Surface quality is one important factor that can include the amount and type of pollution present on the surface. However, another important factor is surface roughness. Methods for determining surface roughness differ in their lateral and height resolution and also by the type of information that each method provides, such as: profile, image of defects, power-spectral-density, surface auto-correlation function, or different statistical parameters such as the root-mean-square (rms) height (or roughness) δ.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Youssef Haidar, Frederique de Fornel, Chouki Zerouki, and Patrick Pinot "Study of the roughness and optical near field of mass surface by using a SNOM with shear-force regulation", Proc. SPIE 5458, Optical Micro- and Nanometrology in Manufacturing Technology, (17 August 2004); https://doi.org/10.1117/12.545692
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KEYWORDS
Near field optics

Near field scanning optical microscopy

Near field

Surface roughness

Spatial frequencies

Surface finishing

Polarization

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